Machine learning architecture evaluation for fast and accurate weak point detection
Autor: | Kim, Ryoung-Han, Lafferty, Neal V., Lee, Yi, Schroeder, Uwe Paul, Rezaeifakhr, Pouya, Wang, Lynn, Villarreal, David |
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Zdroj: | Proceedings of SPIE; April 2023, Vol. 12495 Issue: 1 p1249519-1249519-7 |
Databáze: | Supplemental Index |
Externí odkaz: |