Machine learning architecture evaluation for fast and accurate weak point detection

Autor: Kim, Ryoung-Han, Lafferty, Neal V., Lee, Yi, Schroeder, Uwe Paul, Rezaeifakhr, Pouya, Wang, Lynn, Villarreal, David
Zdroj: Proceedings of SPIE; April 2023, Vol. 12495 Issue: 1 p1249519-1249519-7
Databáze: Supplemental Index