Electric field mapping of wide-bandgap semiconductor devices at a submicrometre resolution
| Autor: | Fujioka, Hiroshi, Morkoç, Hadis, Schwarz, Ulrich T., Cao, Yuke, Pomeroy, James W., Wang, Jingshan, Fay, Patrick, Shankar, Bhawani, Chowdhury, Srabanti, Kuball, Martin |
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| Zdroj: | Proceedings of SPIE; March 2023, Vol. 12421 Issue: 1 p124210E-124210E-5, 1117896p |
| Databáze: | Supplemental Index |
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