Polarization-based, transmissive-reflective beam scanner operating around 1550 nm using off-the-shelf components

Autor: Busse, Lynda E., Soskind, Yakov, Baker, Jordan L., Lang, Kenneth A., Dickensheets, David L., Nakagawa, Wataru
Zdroj: Proceedings of SPIE; March 2023, Vol. 12428 Issue: 1 p124280C-124280C-7, 1118528p
Databáze: Supplemental Index