Deep-learning-based visual inspection of facets and p-sides for efficient quality control of diode lasers
| Autor: | Zediker, Mark S., Zucker, Erik P., Zink, Christof, Ekterai, Michael, Martin, Dominik, Clemens, William, Maennel, Angela, Mundinger, Konrad, Richter, Lorenz, Crump, Paul, Knigge, Andrea |
|---|---|
| Zdroj: | Proceedings of SPIE; March 2023, Vol. 12403 Issue: 1 p124030E-124030E-18, 12278989p |
| Databáze: | Supplemental Index |
| Externí odkaz: |
|