Precision measurement of molded optics including relational datum parameters by use of a scanning point multi-wavelength interferometer

Autor: Symmons, Alan, Claytor, Nelson E., Hennemann, N., Wendel, M.
Zdroj: Proceedings of SPIE; October 2022, Vol. 12219 Issue: 1 p122190E-122190E-6, 1099717p
Databáze: Supplemental Index