Mitigation of the etch-induced intra-field overlay contribution

Autor: Bannister, Julie, Mohanty, Nihar, van Haren, Richard, Yildirim, Oktay, Mouraille, Orion, van Dijk, Leon, Kumar, Kaushik, Feurprier, Yannick, Jehoul, Christiane, Hermans, Jan
Zdroj: Proceedings of SPIE; May 2022, Vol. 12056 Issue: 1 p120560D-120560D-12, 11935453p
Databáze: Supplemental Index