| Autor: |
Xiao, Yanan, Hayakawa, Shinjiro, Gohshi, Yohichi, Oshima, Masaharu |
| Zdroj: |
Analytical Sciences; December 1998, Vol. 14 Issue: 6 p1139-1144, 6p |
| Abstrakt: |
The chemical shift of the characteristic fluorescence X-ray emission line is far smaller than the resolution of a detector widely used in energy-dispersive spectroscopy, such as a Si(Li) detector. The line position measured with this kind of detector greatly depends on many factors. In the present work, an energy-dispersive X-ray spectroscopy method was introduced to precisely measure the chemical shift of the characteristic X-ray emission line by partitioning the measurement time into many subdivisions with a statistical data-processing procedure. The possibility of this method was also considered theoretically. The chemical state of an element could be identified by using a reference material. The discrimination limit was found to be less than 0.3 eV if electric signal processing could be carefully controlled. |
| Databáze: |
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| Externí odkaz: |
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