Flip-chip-integrated silicon nitride ECL at 640nm with relaxed alignment tolerances
| Autor: | Reed, Graham T., Knights, Andrew P., Kluge, Ines, Schulten, Michael, Tabatabaei Mashayekh, Alireza, Rodrigo, Rebecca, Ackermann, Manuel, Ghannam, Ibrahim, Stassen, Andim, Merget, Florian, Leisching, Patrick, Witzens, Jeremy |
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| Zdroj: | Proceedings of SPIE; March 2022, Vol. 12006 Issue: 1 p120060E-120060E-9, 1080550p |
| Databáze: | Supplemental Index |
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