| Autor: |
Geissler, J., Goering, E., Weigand, F., Schütz, G. |
| Zdroj: |
International Journal of Materials Research: Zeitschrift fuer Metallkunde; February 2022, Vol. 93 Issue: 10 p946-952, 7p |
| Abstrakt: |
The magnetization depth profiles of Pt have been investigated by X-ray resonant magnetic reflectivity measurements of sputtered Pt/Co bilayer systems with different chemical roughness values at the Pt/Co interface. The asymmetry ratio as a function of the angle of incidence has been measured at the Pt L3near-edge absorption region at the maximum of the X-ray magnetic circular dichroism effect. The observed asymmetry ratios in the order of 0.5% are described quantitatively on the basis of a magnetically modified optical approach. The curves of the extracted magnetization profiles in the Pt layer show a different behavior corresponding to chemical roughness, while the magnetic saturation moment of Pt at the Pt/Co interface remains unaltered. |
| Databáze: |
Supplemental Index |
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