Influence of defect structure on characteristics of X- and γ-radiation detectors based on CdTe:Cl according to high-resolution X-ray diffractometry
| Autor: | Angelsky, Oleg V., Fodchuk, I., Kuzmin, A., Maslyanchuk, O., Hutsuliak, I., Solodkyi, M., Roman, Yu., Boledzyuk, I., Pynuk, P., Solovan, M., Gudymenko, O. |
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| Zdroj: | Proceedings of SPIE; December 2021, Vol. 12126 Issue: 1 p121261K-121261K-9, 1091359p |
| Databáze: | Supplemental Index |
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