A chip-level 400G integrated coherent receiver optical-electronic testing system

Autor: Wang, Yuelin, Xie, Huikai, Xiao, Yun-Feng, Lei, Xun, Cao, Quan, Zhu, Shichao, Yu, Sheng, Lu, Luluzi, Cheng, Yongpeng, Jiang, Hao
Zdroj: Proceedings of SPIE; November 2021, Vol. 12066 Issue: 1 p120661C-120661C-4, 1085954p
Databáze: Supplemental Index