| Autor: |
Martins, L. F. O., Mello, R. M. Q., Sartorelli, M. L., Hümmelgen, I. A. |
| Zdroj: |
Physica Status Solidi (A) - Applications and Materials Science; April 2004, Vol. 201 Issue: 5 p902-907, 6p |
| Abstrakt: |
In this work we investigated the surface morphology of electrodeposited polyaniline (PANI) and sulfonated polyaniline (SPAN) films grown directly on Si or on Au/glass substrates respectively, by applying constant or square wave potentials. Atomic force micrographs of samples with thicknesses in the range of 20 to 800 nm showed compact and granular surfaces with roughness varying between 3 and 30 nm. To investigate the evolution of roughness in a more quantitative way scaling analysis was applied, revealing characteristics of a self-affine fractal surface with exponents showing a dependence on the material (PANI or SPAN) and on the applied potential (constant or square wave). (© 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim) |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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