| Autor: |
Naudon, André, Babonneau, David |
| Zdroj: |
International Journal of Materials Research: Zeitschrift fuer Metallkunde; December 2021, Vol. 88 Issue: 8 p596-600, 5p |
| Abstrakt: |
Concerning small scattering objects (aggregates) in a very thin layer, their characterization by small-angle scattering of X-rays in the transmission mode is difficult because the recorded intensity is very weak, owing to the very short X-ray path in the layer. Grazing incidence X-ray scattering circumvents this difficulty, precisely because the X-ray path inside the thin layer to be analyzed is considerably increased, while the background remains sufficiently low. Full potentiality of this technique is obtained when using a synchrotron source (flux, collimation and choice of the wavelength in order to avoid fluorescence or to perform anomalous measurements) and when patterns are recorded with two-dimensional detectors, e.g. gas detectors or imaging plates (IPs). |
| Databáze: |
Supplemental Index |
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