| Autor: |
Bailey, G.W., Alexander, K.B., Jerome, W.G., Bond, M.G., McCarthy, J.J., Walck, S. D., Ruzakowski-Athey, P. |
| Zdroj: |
Microscopy and Microanalysis; July 1998, Vol. 4 Issue: Supplement 2 p342-343, 2p |
| Abstrakt: |
The analysis of Selected Area Diffraction (SAD) patterns that are collected from a single phase material having sufficient crystallites to provide continuous rings is relatively straightforward. However, when this condition is not met and there may be several phases present having rings of a spotty nature, the pattern is complex and can be quite difficult to analyze manually because of the vast number of discrete spots. WinJade from MDI is an X-ray diffraction (XRD) analysis program with an Electron Diffraction Program Module (EDPM) that can be used to aid in the analysis of SAD patterns. The EDPM produces Integrated Circular Density Plots (ICDP), which are one-dimensional intensity profiles plotted as a function of equivalent XRD 20 values or crystal d-spacings. These ICDP's can be overlayed with XRD patterns or with reference lines from the NIST and JCPDS crystalline databases for direct comparisons. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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