| Autor: |
Woo, Jonathan W., Forrey, Robert C., Cho, Kyeongjae |
| Zdroj: |
The Astrophysical Journal; March 1997, Vol. 477 Issue: 1 p235-240, 6p |
| Abstrakt: |
We present an astrophysical extended X-ray absorption fine-structure (EXAFS) analysis (AEA) tool. The AEA tool is designed to generate a numerical model of the modification to the X-ray absorption coefficient due to the EXAFS phenomenon. We have constructed a complete database (elements up to the atomic number 92) of EXAFS parameters: central atom phase shift (2?1), backscattering phase shift (b), and backscattering amplitude (F). Using the EXAFS parameter data base, the AEA tool can generate a numerical model of any compound when the atomic numbers of neighboring atoms and their distances to the central X-ray-absorbing atom are given. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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