| Autor: |
Kei Kobayashi, Kei Kobayashi, Hirofumi Yamada, Hirofumi Yamada, Toshihisa Horiuchi, Toshihisa Horiuchi, Kazumi Matsushige, Kazumi Matsushige |
| Zdroj: |
Japanese Journal of Applied Physics; December 1999, Vol. 38 Issue: 12 pL1550-L1550, 1p |
| Abstrakt: |
Dynamic force microscopy (DFM) was applied for investigating on the structures of C60multilayer thin films deposited on the Si(111)-7 ×7 reconstructed surface. C60molecules on the crystalline island have been successfully imaged with a molecular resolution for the first time in an ultrahigh vacuum environment. In addition, a difference in the contrast of phase image between the islands and the monolayer-covered Si surface was observed. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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