| Autor: |
Veldkamp, Markus, Erko, Alexei, Gudat, Wolfgang, Abrosimov, Nikolai V., Alex, Volker, Khasanov, Salavat, Shekhtman, Veniamin, Neissendorfer, Frank, Pietsch, Ullrich |
| Zdroj: |
Japanese Journal of Applied Physics; January 1999, Vol. 38 Issue: 1 p612-612, 1p |
| Abstrakt: |
Using the BESSY I wavelength shifter (WLS) beamline we have examined the energy resolution of a laterally graded Si1-xGexcrystal in the full divergent, white synchrotron beam. At the Fe-K absorption edge (E = 7112 eV) we have measured an energy resolution of E/?E=7.1·104for the (440) reflection and a vertical divergence of 0.63 mrad. For a pure Si(440) reference crystal and the same divergence we found E/?E=7.1·103which means a factor of 10 improvement in the case of the laterally graded crystal. Similar results have been obtained at the Co-K absorption edge (E = 7710 eV) with an increase of 2.6 for E/?E. We present the experimental set-up and a method for the characterization of the absolute lattice parameter with a precision of ?d/d=2·10-5. In addition, we discuss the application of the laterally graded Si1-xGexcrystals in the crystal monochromator KMC-2 at the BESSY II storage ring. |
| Databáze: |
Supplemental Index |
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