| Autor: |
Schoenfeld, Olaf, Hempel, Thomas, Zhao, Xinwei, Takuo Sugano, Takuo Sugano, Yoshinobu Aoyagi, Yoshinobu Aoyagi |
| Zdroj: |
Japanese Journal of Applied Physics; November 1994, Vol. 33 Issue: 11 p6082-6082, 1p |
| Abstrakt: |
Optical and electrical properties were correlated with structural investigations during the amorphous-to-microcrystalline phase transition of magnetron-sputtered silicon thin films. The optical characterization was carried out using the Tauc formalism, and the electrical transport phenomena were studied by means of thermal activated conductivity measurements. The absorption measurements show a sharp increase of the grain boundary states corresponding to a bent Tauc plot during the crystallization. This increase of grain boundary states leads to a drastic drop of the activation energy of the conductivity to zero. A new model of combined grain boundary states is introduced to explain the electric and optical behavior in such new microcrystalline materials. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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