Application of Electron Beam-Acoustic Microscope to Semiconductors
| Autor: | Morizuka, Kouhei, Adachi, Yoshio, Ikoma, Toshiaki |
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| Zdroj: | Japanese Journal of Applied Physics; January 1982, Vol. 21 Issue: 1 p449-449, 1p |
| Databáze: | Supplemental Index |
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