| Autor: |
Goto, Hiroshige, Adachi, Yoshio, Ikoma, Toshiaki |
| Zdroj: |
Japanese Journal of Applied Physics; October 1979, Vol. 18 Issue: 10 p1979-1979, 1p |
| Abstrakt: |
A simplified method of determining the energy level and the capture cross-section of a deep level from the DLTS spectrum is proposed, together with a detailed analysis of its spectrum shape. Since this method requires only a single temperature scan, the time necessary to determine parameters from the DLTS becomes greatly shortened. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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