Contour-based metrology for assessment of edge placement error and its decomposition into global/local CD uniformity and LELE intralayer overlay

Autor: Adan, Ofer, Robinson, John C., Zhou, Wenzhan, Wei, Fang, Zhang, Yu, Zhu, Jun, Hu, Chan-Yuan, Cho, Kyoyeon, Corradi, Antonio, Pao, Kuo-Feng, Jain, Vivek, Elmalk, Abdalmohsen, Raghunathan, Sudharshanan, Hunsche, Stefan, Zhu, Robbin, Chen, Selena, Lin, Luke, Liang, Leon, Liu, Lei
Zdroj: Proceedings of SPIE; February 2021, Vol. 11611 Issue: 1 p116111Y-116111Y-8, 1045008p
Databáze: Supplemental Index