An innovative probe microscopy solution for measuring conductivity profiles in 3-dimensions
| Autor: | Adan, Ofer, Robinson, John C., Celano, U., Paredis, K., Humphris, A. D. L., Tedaldi, M., O'Sullivan, C., Hole, J. P., Goulden, J. |
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| Zdroj: | Proceedings of SPIE; February 2021, Vol. 11611 Issue: 1 p116110J-116110J-6, 1044997p |
| Databáze: | Supplemental Index |
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