Solutions for environmentally robust interferometric optical testing

Autor: Kim, Dae Wook, Rascher, Rolf, McDonnell, Erin M., Deck, Leslie L.
Zdroj: Proceedings of SPIE; August 2020, Vol. 11487 Issue: 1 p114870J-114870J-8, 1033839p
Databáze: Supplemental Index