In SituReaction Mechanism Study on Atomic Layer Deposition of Intermetallic Co3Sn2Thin Films

Autor: Nieminen, Heta-Elisa, Kaipio, Mikko, Ritala, Mikko
Zdroj: Chemistry of Materials; October 2020, Vol. 32 Issue: 19 p8120-8128, 9p
Abstrakt: In this work, a growth mechanism of an intermetallic Co3Sn2thin film is studied in situwith a quartz crystal microbalance (QCM) and quadrupole mass spectrometer (QMS). The film is deposited by atomic layer deposition (ALD) from CoCl2(TMEDA) and Bu3SnH precursors (TMEDA = N,N,N′,N′-tetramethylethylenediamine). Balanced reaction equations are resolved by fitting the QMS and QCM data, and a step-by-step growth mechanism is determined for the process. During the CoCl2(TMEDA) pulse, only 1-chlorobutane is formed as a byproduct. However, during the Bu3SnH pulse, two byproducts, BuCl and Bu3SnCl, were clearly detected, indicating that two competing reaction pathways exist during that pulse. Preliminary studies on another intermetallic ALD process, Ni3Sn2, revealed that the reactions occur similarly as in the Co3Sn2process.
Databáze: Supplemental Index