Correction to Structural Tolerance Factor Approach to Defect-Resistant I2-II-IV-X4Semiconductor Design

Autor: Sun, Jon-Paul, McKeown Wessler, Garrett C., Wang, Tianlin, Zhu, Tong, Blum, Volker, Mitzi, David B.
Zdroj: Chemistry of Materials; July 2020, Vol. 32 Issue: 13 p5925-5926, 2p
Databáze: Supplemental Index