| Autor: |
Funak, F., Mandelis, A., Munidasa, M., Funak, F., Mandelis, A., Munidasa, M. |
| Zdroj: |
Journal de Physique IV - Proceedings; September 1994, Vol. 4 Issue: 1 pC7-95-C7-98, 95792p |
| Abstrakt: |
A technique for obtaining thermal diffusivity depth profiles of inhomogeneities in two-layered systems is discussed. The method uses incremental differences in the photothermal signal frequency response of a sample with the inhomogeneous surface layer compared to a homogeneous reference sample. Applications to machined steel samples are reported. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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