HREM Characterization of Interfaces in Thin MOCVD Superconducting Films

Autor: Dorignac, D., Schamm, S., Grigis, Ch., Santiso, J., Garcia, G., Figueras, A., Dorignac, D., Schamm, S., Grigis, Ch., Santiso, J., Garcia, G., Figueras, A.
Zdroj: Journal de Physique IV - Proceedings; June 1995, Vol. 5 Issue: 1 pC5-927-C5-934, 9275930p
Abstrakt: This paper is concerned with high-Tc, superconducting compounds produced by metal-organic chemical vapour deposition. The nanostructure of different types of interfaces - yttria stabilized zirconia buffer / (1-102)-sapphire substrate, YBa2Cu3O7-xfilm / Y2O3precipitates as well as YBa2Cu3O7-xfilm / (001)-NdGaO3, -SrTiO3, and -MgO substrates - has been investigated by high resolution electron microscopy. The orientation relationships and the corresponding layer sequences across the interfaces have been determined with the aid of computer simulations.
Databáze: Supplemental Index