| Autor: |
Dogheche, E., Jaber, B., Lansiaux, X., Rèmiens, D., Dogheche, E., Jaber, B., Lansiaux, X., Rèmiens, D. |
| Zdroj: |
Journal de Physique IV - Proceedings; June 1998, Vol. 8 Issue: 1 pPr9-277-Pr9-280, 2779272p |
| Abstrakt: |
Thin films of lead titanate (PbTiO3-PT) have been prepared in-situ on SrTiO3(100) substrates using radio-frequency sputtering. The epitaxial quality of the films has been investigated as a function of the substrate temperature. Stoichiometric films have been obtained in the temperature range 550°C-600°C. Films have a high degree of c-axis oriented crystalline structure. The optimum conditions for growing epitaxial PbTiO3layers are reported in this study. Thin films grown at 550°C exhibited a rocking curve full width at a half maximum (FWHM) of 0.26°. The refractive index calculated from optical transmission method has been evaluated to 2.61 @ 632.8nm, which represents 98% of the corresponding bulk material. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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