| Autor: |
de Freitas, L. R., Mansanares, A. M., da Silva, E. C., Pimentel, M. C.B., Finco, S., Tessier, G., Fournier, D., de Freitas, L. R., Mansanares, A. M., da Silva, E. C., Pimentel, M. C.B., Finco, S., Tessier, G., Fournier, D. |
| Zdroj: |
Journal de Physique IV - Proceedings; June 2005, Vol. 125 Issue: 1 p121-124, 4p |
| Abstrakt: |
In this paper we present thermoreflectance measurements on polycrystalline silicon conducting tracks for several wavelengths of the probe beam. Two distinct experimental setup were employed, namely, the CCD camera setup and the focused laser setup. It is shown that the thermoreflectance signal behavior is closely related to the derivative of the optical reflectance with respect to the wavelength. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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