A DOE study of plasma etched microlens shape for CMOS image sensors

Autor: Gronheid, Roel, Sanders, Daniel P., Ristoiu, Delia, Leverd, François, Mortini, Etienne, Huguenin, Jean-Luc
Zdroj: Proceedings of SPIE; May 2020, Vol. 11326 Issue: 1 p113260O-113260O-9, 1019350p
Databáze: Supplemental Index