Application of alternative developer solutions for EUV lithography

Autor: Felix, Nelson M., Lio, Anna, Santillan, Julius Joseph, Harumoto, Masahiko, Stokes, Harold, Mori, Chisayo, Tanaka, Yuji, Arisawa, You, Motono, Tomohiro, Asai, Masaya, Itani, Toshiro
Zdroj: Proceedings of SPIE; March 2020, Vol. 11323 Issue: 1 p113231W-113231W-7, 1019087p
Databáze: Supplemental Index