Multilevel memory and synaptic characteristics of a-IGZO thin-film transistor with atomic layer–deposited Al2O3/ZnO/Al2O3stack layers

Autor: Liu, Dan-Dan, Pei, Junxiang, Li, Lingkai, Huo, Jingyong, Wu, Xiaohan, Liu, Wen-Jun, Ding, Shi-Jin
Zdroj: Journal of Materials Research; April 2020, Vol. 35 Issue: 7 p732-737, 6p
Abstrakt: Abstract
Databáze: Supplemental Index
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