Stabilized OEM diode-laser system for metrology applications

Autor: Soskind, Yakov, Busse, Lynda E., Nölleke, Christian, Kolodzie, Niklas, Winkler, Lisa, Thiem, Hendrick, Reggentin, Matthias, Leisching, Patrick
Zdroj: Proceedings of SPIE; March 2020, Vol. 11287 Issue: 1 p1128706-1128706-6
Databáze: Supplemental Index