Stabilized OEM diode-laser system for metrology applications
Autor: | Soskind, Yakov, Busse, Lynda E., Nölleke, Christian, Kolodzie, Niklas, Winkler, Lisa, Thiem, Hendrick, Reggentin, Matthias, Leisching, Patrick |
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Zdroj: | Proceedings of SPIE; March 2020, Vol. 11287 Issue: 1 p1128706-1128706-6 |
Databáze: | Supplemental Index |
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