| Autor: |
Hylsky, Josef, Strachala, David, Vanek, Jiri |
| Zdroj: |
ECS Transactions; December 2017, Vol. 81 Issue: 1 p185-190, 6p |
| Abstrakt: |
In this paper, the extent of PID (Potential Induced Degradation) impacts on a photovoltaic plant fitted with silicon-based modules is studied. In the first step, a PID degradation is diagnosed and confirmed by a thermal imager. Subsequently, the PV modules are uninstalled and transferred to an accredited workplace where are measured current-voltage characteristics. From these results, the maximum power - PMPP of PV modules is determined as a parameter indicating the extent of the PID degradation. The maximum dependence of the PMPP on the negative voltage potential concludes that the PID degradation range of the PV modules is not directly proportional to the negative voltage potential. These results are accompanied by the PV module electroluminescence measurement. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
|
