| Autor: |
Tong, Xiaofeng, Vang, Peter, Hauch, Anne, Chen, Ming |
| Zdroj: |
ECS Transactions; July 2019, Vol. 91 Issue: 1 p2433-2442, 10p |
| Abstrakt: |
An ongoing challenge for solid oxide electrolysis cells (SOECs) operated at high current densities, is the considerable long-term degradation of the most commonly used Ni/yttria-stabilized zirconia (YSZ) H2-electrode. In this work, we report a scalable route of infiltrating nano-sized electrocatalysts into the Ni/YSZ electrode of the cell after it has been reduced in a "one-atmosphere-reduction" process to address this challenge. The performance and durability of an infiltrated cell and a non-infiltrated sister-cell are evaluated. The infiltrated cell exhibits significantly enhanced long-term durability at high current densities, with cell voltage degradation rates of 0.028 V kh-1 (2.04 % kh-1) at [?]1.25 A cm-2 and 0.010 V kh-1 (0.78 % kh-1) at [?]1.00 A cm-2. These degradation rates are [?]14 times and [?]25 times less than those of the non-infiltrated cell, respectively. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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