Defect structure of high-resistivity CdTe:Cl crystals according to the data of high-resolution x-ray diffractometry
| Autor: | Angelsky, Oleg V., Fodchuk, I., Kuzmin, A., Hutsuliak, I., Solodkyi, M., Dovganyuk, V., Maslyanchuk, O., Roman, Yu., Zaplitnyy, R., Gudymenko, O., Kladko, V., Mоlоdkin, V., Lizunov, V. |
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| Zdroj: | Proceedings of SPIE; February 2020, Vol. 11369 Issue: 1 p113691H-113691H-12, 11255422p |
| Databáze: | Supplemental Index |
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