| Autor: |
Cherkasov, D A, Panov, D V, Doludenko, I M, Kanevskiy, V M, Muslimov, A E, Zagorskiy, D L, Biziaev, D A, Bukharaev, A A |
| Zdroj: |
IOP Conference Series: Materials Science and Engineering; December 2019, Vol. 699 Issue: 1 p012005-012005, 1p |
| Abstrakt: |
This article discusses the use of scanning microscopy in the study of one-dimensional nanostructures - nanowires. The nanowires were produced by matrix synthesis. Atomic force microscopy (AFM) of conical nanowires was carried out, and layered nanowires were investigated by AFM and magnetic force microscopy (MFM) methods. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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