Deep learning for automated defect detection in high-reliability electronic parts
| Autor: | Zelinski, Michael E., Taha, Tarek M., Howe, Jonathan, Awwal, Abdul A. S., Iftekharuddin, Khan M., Donahue, Emily A., Quach, Tu-Thach, Potter, Kevin, Martinez, Cari, Smith, Matthew, Turner, Christian D. |
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| Zdroj: | Proceedings of SPIE; September 2019, Vol. 11139 Issue: 1 p1113907-1113907-11 |
| Databáze: | Supplemental Index |
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