Novel UV line beam system for large area processing with 248 nm

Autor: Hahlweg, Cornelius F., Mulley, Joseph R., Trenn, Matthias, Delmdahl, Ralph, Sperling, Patrick
Zdroj: Proceedings of SPIE; September 2019, Vol. 11105 Issue: 1 p1110502-1110502-7
Databáze: Supplemental Index