Influence of test bench parameters on determination of CMOS -cameras feature

Autor: Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Minh, Dinh B., Korotaev, Valery V., Yaryshev, Sergey N., Maraev, Anton A., Nekrylov, Ivan S., Vasileva, Anna V.
Zdroj: Proceedings of SPIE; August 2019, Vol. 11056 Issue: 1 p110562H-110562H-6, 995065p
Databáze: Supplemental Index