EUV pellicle qualification on transmission and reflectance

Autor: Ando, Akihiko, Missalla, T., Biermanns-Föth, A., Pampfer, C., Arps, J., Phiesel, C., Piel, C., Lebert, R.
Zdroj: Proceedings of SPIE; June 2019, Vol. 11178 Issue: 1 p111780O-111780O-9, 1006030p
Databáze: Supplemental Index