Color mixing in overlay metrology for greater accuracy and robustness

Autor: Ukraintsev, Vladimir A., Adan, Ofer, Mathijssen, Simon, Noot, Marc, Bozkurt, Murat, Javaheri, Narjes, Hajiahmadi, Reza, Zagaris, Antonios, Chang, Ken, Gosali, Benny, Su, Eason, Wang, Cathy, den Boef, Arie, Bhattacharyya, Kaustuve, Huang, Guo-Tsai, Chen, Kai-Hsiung, Lin, John
Zdroj: Proceedings of SPIE; May 2019, Vol. 10959 Issue: 1 p109591G-109591G-8, 986328p
Databáze: Supplemental Index