New silicon hard mask material development for sub-5nm node

Autor: Gronheid, Roel, Sanders, Daniel P., Seko, Tomoaki, Kasai, Tatsuya, Serizawa, Ryuuichi, Dei, Satoshi, Sakai, Tatsuya
Zdroj: Proceedings of SPIE; March 2019, Vol. 10960 Issue: 1 p1096025-1096025-7
Databáze: Supplemental Index