| Autor: |
Yoshikawa, M., Okamoto, Y., Kawamori, E., Watabe, C., Watanabe, Y., Furukawa, T., Ikeda, K., Yamaguchi, N., Tamano, T., Yatsu, K. |
| Zdroj: |
Fusion Technology; January 2001, Vol. 39 Issue: 1 p289-292, 4p |
| Abstrakt: |
We constructed spectroscopic measurement systems that cover the wavelength range from soft X-ray (SX) to visible lights for impurity ion diagnostics in the GAMMA 10. We observed the absolute impurity line intensities, Doppler line broadening and time dependent radial profiles of the impurity ion emissions. We determined the radiation loss and impurity ion density in the GAMMA 10. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
|
