Applying MPC for EUV mask fabrication

Autor: Gallagher, Emily E., Rankin, Jed H., Tsunoda, Dai, Torigoe, Yohei, Sato, Yutaro, Hamaji, Masakazu, Chua, Gek-Soon, Bürgel, Christian
Zdroj: Proceedings of SPIE; October 2018, Vol. 10810 Issue: 1 p108101H-108101H-9, 972919p
Databáze: Supplemental Index