| Autor: |
Cazes, M., Pizzetti, Christian, Daviot, Jerome, Garnier, Philippe, Broussous, Lucile, Gabette, Laurence, Besson, Pascal |
| Zdroj: |
Diffusion and Defect Data Part B: Solid State Phenomena; August 2018, Vol. 282 Issue: 1 p121-125, 5p |
| Abstrakt: |
A post-etch residue cleaning formulation, based on balancing the aggressiveness of hydrofluoric acid with its well-known residue removal properties is introduced. In a series of investigations originally motivated by the cleaning challenge provided by high-k dielectric-based residues, a formulation platform is developed that successfully cleans residues resulting from the plasma patterning of tantalum oxide and similar materials while maintaining metal and dielectric compatibility. It is further shown that the fundamental advantages of this solution can be extended to the cleaning of other, more traditional post-etch residues, with no sacrifice in compatibility, as demonstrated by measurements on blanket films and through SEM data. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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