Selected technological aspects of semiconductor samples preparation for Hall effect measurements
| Autor: | Struk, Przemyslaw, Pustelny, Tadeusz, Gorczyca, Kinga, Boguski, Jacek, Wróbel, Jarosław, Martyniuk, Piotr |
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| Zdroj: | Proceedings of SPIE; August 2018, Vol. 10830 Issue: 1 p108300V-108300V-5, 974706p |
| Databáze: | Supplemental Index |
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