| Autor: |
Duparré, Angela, Ruppe, Carsten, Pischow, Kaj A., Adamik, Miklós, Barna, P.B. |
| Zdroj: |
Thin Solid Films; June 1995, Vol. 261 Issue: 1-2 p70-75, 6p |
| Abstrakt: |
Two methods are described of preparing and investigating cross-sections of single layer and multilayer optical coatings by atomic force microscopy (AFM). The first consists of mechanical grinding and polishing followed by a final ion-polishing and etching procedure. The second is simply mechanically fracturing. The results obtained from both preparation methods are compared. In addition, cross-sectional transmission electron microscopy has been used to verify the AFM results. |
| Databáze: |
Supplemental Index |
| Externí odkaz: |
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