Illumination source optimization in EUV lithography for staggered contact holes and pillars for DRAM applications

Autor: Goldberg, Kenneth A., Felix, Nelson M., Finders, Jo, Wang, Ziyang, McNamara, John, Rispens, Gijsbert, Broman, Pär, Ahn, Chang-Nam, Lee, Inhwan, Kim, Hwan, Kang, Junghyun, Hyun, Yoonsuk, Lim, Chang-Moon
Zdroj: Proceedings of SPIE; March 2018, Vol. 10583 Issue: 1 p105830Y-105830Y-6, 952477p
Databáze: Supplemental Index