Atomic concentrations of binary compound thin films on elemental substrates determined by Rutherford backscattering techniques
| Autor: | Petrov, I., Braun, M., Fried, T., Sätherblom, H. E. |
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| Zdroj: | Journal of Applied Physics; March 1983, Vol. 54 Issue: 3 p1358-1364, 7p |
| Databáze: | Supplemental Index |
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